Reliability, Yield, and Stress Burn-In

Reliability, Yield, and Stress Burn-In

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This book will also help readers to analyze systems that exhibit high failure rate during a long infant mortality period. Reliability, Yield, and Stress Burn-In presents ways to systematically analyze burn-in policy at that component, sub-system, and system levels. Various statistical methods are addressed including parametric, nonparametric, and Bayesian approaches. Many case studies are introduced in combination with the developed theories. Included in the book is an introduction to software reliability.1986, pp 950-967. [3] Agarwala, A.S., aquot;Shortcomings in MIL-STD-1629A guidelines for criticality analysis, aquot; ... [13] ATaamp;T, ATaamp;T Reliability Manual. Edited by Klinger.D.J., Nakada.Y., and Meenedez.M.A., Van Nostrand Rheinhold, New York, anbsp;...

Title:Reliability, Yield, and Stress Burn-In
Author: Way Kuo, Wei-Ting Kary Chien, Taeho Kim
Publisher:Springer Science & Business Media - 1998

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